Basics Of Film Thickness Measurement Solutions

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Thin Film Deposition is usually a vacuum technology for implementing coatings of pure materials on the surface of various objects. The coatings, also named films are usually in the thickness range of angstroms to microns and can be a single material or could be multiple materials in a layered structure. There are many solutions which are used for measuring film thickness of the thin films.

Just one major class of depositing techniques is evaporation, involving heating a solid material inside of a high vacuum chamber, taking it into a temperature which produces many vapor pressure. Inside your vacuum, even a relatively low vapor pressure is sufficient to raise a vapor cloud within the chamber. This evaporated material condenses on surfaces inside chamber as a shell or "film". This procedure, including the general form of chamber designs commonly for it, is an excellent applicant for successful control of rate and thickness by making use of quartz crystals.

The key concept behind this sort of measurement and control is an oscillator crystal can be suitably mounted within the vacuum chamber to receive deposition instantly and be affected by it in a measurable means. Specifically the oscillation frequency will drop because crystal's mass is increased from the material being deposited on there. To complete the measurement system, an electronic guitar continuously reads the rate of recurrence and performs appropriate exact functions to convert of which frequency data to thickness data, both instantaneous price and cumulated thickness.

This kind of sensors and instruments are readily commercially available, including within an integrated package that not just reads and displays your rate and thickness info, but also provides results for other deposition method elements. 

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